GB/T 17626.11-2008 English PDF (GBT17626.11-2008)

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GB/T 17626.11-2008: Electromagnetic compatibility -- Testing and measurement techniques -- Voltage dips, short interruptions and voltage variations immunity tests
GB/T 17626.11-2008
ICS 33.100.20
L 06
GB
National Standard
of The People’s Republic of China
GB/T 17626.11-2008/IEC 61000-4-11.2004
Replacing GB/T 17626.11-1999
Electromagnetic compatibility –
Testing and measurement techniques –
Voltage dips, short interruptions and voltage variations
immunity tests
(IEC 61000-4-11.2004, IDT)
ISSUED ON. MAY 20, 2008
IMPLEMENTED ON. JANUARY 1, 2009
Issued by. The General Administration of Quality Supervision, Inspection and Quarantine
of PRC; and China National Standardization Administration Committee
Table of Contents
Preface ... 3
1 Scope ... 6
2 Normative references ... 7
3 Terms and definitions ... 7
4 General ... 9
5 Test levels ... 10
6 Test instrumentation ... 14
7 Test set-up ... 16
8 Test procedures ... 17
9 Evaluation of test results ... 19
10 Test report ... 20
Annex A (normative) Test circuit details ... 21
Annex B (informative) Electromagnetic environment classes ... 23
Annex C (informative) Test instrumentation ... 24
References ... 27
Preface
GB/T 17626 EMC Testing and Measurement Techniques currently includes the following
components.
GB/T 17626.1-2006 Electromagnetic compatibility Testing and measurement techniques
Overview of immunity tests
GB/T 17626.2-2006 Electromagnetic compatibility Testing and measurement techniques
Electrostatic discharge immunity test
GB/T 17626.3-2006 Electromagnetic compatibility Testing and measurement techniques
Radiated, radio-frequency, Electromagnetic field immunity test
GB/T 17626.4-2006 Electromagnetic compatibility Testing and measurement techniques
Electrical fast transient/burst immunity test
GB/T 17626.5-2006 Electromagnetic compatibility Testing and measurement techniques
Surge immunity test
GB/T 17626.6-2006 Electromagnetic compatibility Testing and measurement techniques
Immunity to conducted disturbance, induced by radio-frequency fields
GB/T 17626.7-2006 Electromagnetic compatibility Testing and measurement techniques
--General guide on harmonics and interharmonics measurements and instrumentation, for
power supply systems and equipment connected thereto
GB/T 17626.8-1998 Electromagnetic compatibility Testing and measurement techniques
Power frequency magnetic field immunity test
GB/T 17626.9-2006 Electromagnetic compatibility Testing and measurement
techniques--Pulse magnetic field immunity test
GB/T 17626.10-2006 Electromagnetic compatibility Testing and measurement techniques
--Damped oscillatory magnetic field immunity test
GB/T 17626.11-2006 Electromagnetic compatibility Testing and measurement techniques
Voltage dips, short interruptions and voltage variations immunity test
GB/T 17626.12-2006 Electromagnetic compatibility Testing and measurement techniques
--Oscillatory waves immunity test
GB/T 17626.13-2006 Electromagnetic compatibility Testing and measurement
techniques-- Harmonics and interharmonics including mains signaling at a.c. power port, low
frequency immunity test
GB/T 17626.14-2006 Electromagnetic compatibility Testing and measurement techniques
--Voltage fluctuation immunity test
GB/T 17626.16-2006 Electromagnetic compatibility Testing and measurement
techniques--Test for immunity to conducted, common mode disturbances in the frequency
range 0Hz to 150kHz
GB/T 17626.17-2006 Electromagnetic compatibility Testing and measurement techniques
--Ripple on d.c. input power port immunity test
GB/T 17626.27-2006 Electromagnetic compatibility Testing and measurement techniques
--Unbalance immunity test
GB/T 17626.28-2006 Electromagnetic compatibility Testing and measurement techniques--
Variation of power frequency, immunity test
GB/T 17626.29-2006 Electromagnetic compatibility Testing and Measurement Techniques.
Voltage Dips, Short Interruptions and Voltage Variations on DC Input Port Immunity Test
This Standard is the Part 11 of GB/T 17626.
This Standard is equivalent to IEC 61000-4-11.2004 (Ed2.0).
This Standard replaces GB/T 17626.11- 1999 Electromagnetic compatibility Testing and
measurement techniques Voltage dips, short interruptions and voltage variations immunity
test.
This Standard has the following main difference from GB/T 17626.11-1999.
—add Electromagnetic compatibility--Guide to the drafting of electromagnetic compatibility
standards in the normative reference.
—add 3 terms. 3.5 residual voltage, 3.7 calibration, 3.8 verification
—add test levels for voltage dips, and give the preferred duration for each level.
—adjust the duration for short interruptions.
—Annex B is changed to describe Electromagnetic environment classes.
Annex A and Annex B of this specification are normative annexes, and Annex B and C are
informative annex.
The specification is proposed and managed by China National EMC Standardization
Technical Committee (SAC/TC 246).
This Standard is developed by Shanghai Electric Apparatus Research Institute (Group) Co.
Ltd. and The Third Research Institute of China Electronics Technology Group Corporation.
The specification is drafted by Shou JianXia, Xing Lin, Lin Jingping He Aiying, Qian
Xiaohua, Cheng Liling.
This Standard replaces all the previous releases.
— GB/T 17626.11-1999
Electromagnetic compatibility –
Testing and measurement techniques –
Voltage dips, short interruptions and voltage variations
immunity tests
1 Scope
This Part of GB/T 17626 defines the immunity test methods and range of preferred test levels
for electrical and electronic equipment connected to low-voltage power supply networks for
voltage dips, short interruptions, and voltage variations.
This Standard applies to electrical and electronic equipment having a rated input current not
exceeding 16 A per phase, for connection to 50 Hz or 60 Hz a.c. networks.
It does not apply to electrical and electronic equipment for connection to 400 Hz a.c.
networks. Tests for these networks will be covered by future IEC standards.
The objective of this Standard is to establish a common reference for evaluating the immunity
of electrical and electronic equipment when subjected to voltage dips, short interruptions and
voltage variations.
NOTE Voltage fluctuation immunity tests are covered by GB/T 17626.14-2006.
The test method documented in this Part of GB/T 17626 describes a consistent method to
assess the immunity of equipment or a system against a defined phenomenon. As described in
GB/Z 18509-2001, this is a basic EMC publication for use by product committees of the IEC.
As also stated in GB/Z 18509-2001, the IEC product committees are responsible for
determining whether this immunity test standard shall be applied or not, and, if applied, they
are responsible for defining the appropriate test levels. The EMC Standardization Technical
committee and its sub-committees are prepared to co-operate with product committees in the
evaluation of the value of particular immunity tests for their products.
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
GB/T 4365-2003 Terminology for radio interference
GB/Z 18509-2001 Electromagnetic compatibility - Guide to the drafting of electromagnetic
compatibility standards
IEC 61000-2-8.2002 Electromagnetic compatibility (EMC) - Part 2-8. Environment-
Voltage dips and ...