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GB/T 17626.11-2023 English PDF (GBT17626.11-2023)

GB/T 17626.11-2023 English PDF (GBT17626.11-2023)

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GB/T 17626.11-2023: Electromagnetic compatibility -- Testing and measurement techniques -- Part 11: Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase
GB/T 17626.11-2023
GB
NATIONAL STANDARD OF THE
PEOPLE’S REPUBLIC OF CHINA
ICS 33.100.20
CCS L 06
Replacing GB/T 17626.11-2008
Electromagnetic compatibility - Testing and measurement
techniques - Part 11: Voltage dips, short interruptions and
voltage variations immunity tests for equipment with input
current up to 16 A per phase
[IEC 61000-4-11:2020, Electromagnetic compatibility (EMC) - Part 4-11: Testing and
measurement techniques - Voltage dips, short interruptions and voltage variations
immunity tests for equipment with input current up to 16 A per phase]
ISSUED ON: MAY 23, 2023
IMPLEMENTED ON: JUNE 01, 2024
Issued by: State Administration for Market Regulation;
Standardization Administration of the People’s Republic of China.
Table of Contents
Foreword ... 3
Introduction ... 7
1 Scope ... 12
2 Normative references ... 12
3 Terms and definitions ... 13
4 General ... 15
5 Test levels ... 15
5.1 General ... 15
5.2 Voltage dips and short interruptions ... 16
5.3 Voltage variations ... 17
6 Test instrumentation ... 20
6.1 Test generator ... 20
6.2 Power source ... 23
7 Test set-up ... 23
8 Test procedures ... 24
8.1 General ... 24
8.2 Laboratory reference conditions ... 24
8.3 Execution of the test ... 25
9 Evaluation of test results ... 26
10 Test report ... 27
Annex A (Normative) Test circuit details ... 29
A.1 Test generator peak inrush current drive capability ... 29
A.2 Current monitor's characteristics for measuring peak inrush current capability ... 29
A.3 EUT peak inrush current requirement ... 30
Annex B (Informative) Electromagnetic environment classes ... 32
Annex C (Informative) Test instrumentation ... 34
Annex D (Informative) Rationale for generator specification regarding voltage, rise-
time and fall-time, and inrush current capability ... 37
D.1 Concept of basic standard ... 37
D.2 IEC 61000-4-11:1994 (first edition) ... 37
D.3 Rationale for the need of rapid fall-times ... 37
D.4 Interpretation of the rise-time and fall-time requirements during EUT testing ... 38
D.5 Main conclusions ... 38
D.6 Rationale for inrush current capability ... 39
Bibliography ... 40
Foreword
This document is drafted in accordance with the rules provided in GB/T 1.1-2020
Directives for standardization - Part 1: Rules for the structure and drafting of
standardizing documents.
This document is Part 11 of GB/T 17626, Electromagnetic compatibility - Testing and
measurement techniques. The following parts have been issued for GB/T 17626:
– GB/T 17626.1-2006, Electromagnetic compatibility - Testing and measurement
techniques - Overview of immunity tests;
– GB/T 17626.2-2018, Electromagnetic compatibility - Testing and measurement
techniques - Electrostatic discharge immunity test;
– GB/T 17626.3-2016, Electromagnetic compatibility - Testing and measurement
techniques - Radiated radio-frequency electromagnetic field immunity test;
– GB/T 17626.4-2018, Electromagnetic compatibility - Testing and measurement
techniques - Electrical fast transient/burst immunity test;
– GB/T 17626.5-2019, Electromagnetic compatibility - Testing and measurement
techniques - Surge immunity test;
– GB/T 17626.6-2017, Electromagnetic compatibility - Testing and measurement
techniques - Immunity to conducted disturbances induced by radio-frequency fields;
– GB/T 17626.7-2017, Electromagnetic compatibility - Testing and measurement
techniques - General guide on harmonics and inter-harmonics measurements and
instrumentation, for power supply systems and equipment connected thereto;
– GB/T 17626.8-2006, Electromagnetic compatibility (EMC) - Part 8: Testing and
measurement techniques - Power frequency magnetic field immunity test;
– GB/T 17626.9-2011, Electromagnetic compatibility - Testing and measurement
techniques - Pulse magnetic field immunity test;
– GB/T 17626.10-2017, Electromagnetic compatibility - Testing and measurement
techniques - Damped oscillatory magnetic field immunity test;
– GB/T 17626.11-2023, Electromagnetic compatibility - Testing and measurement
techniques - Part 11: Voltage dips, short interruptions and voltage variations
immunity tests for equipment with input current up to 16 A per phase;
– GB/T 17626.12-2023, Electromagnetic compatibility - Testing and measurement
techniques - Ring wave immunity test;
– GB/T 17626.13-2006, Electromagnetic compatibility (EMC) - Testing and
measurement techniques - Harmonics and inter-harmonics including mains
signalling at a.c. power port low frequency immunity test;
– GB/T 17626.14-2005, Electromagnetic Compatibility - Testing and measurement
techniques - Voltage fluctuation immunity test;
– GB/T 17626.15-2011, Electromagnetic compatibility - Testing and measurement
techniques - Flickermeter - Functional and design specifications;
– GB/T 17626.16-2007, Electromagnetic compatibility - Testing and measurement
techniques - Test for immunity to conducted common mode disturbances in the
frequency range 0 Hz to 150 kHz;
– GB/T 17626.17-2005, Electromagnetic Compatibility - Testing and measurement
techniques - Ripple on d.c. input power port immunity test;
– GB/T 17626.18-2016, Electromagnetic compatibility - Testing and measurement
techniques - Damped oscillatory wave immunity test;
– GB/T 17626.19-2022, Electromagnetic compatibility - Testing and measurement
techniques - Part 19: Test for immunity to conducted, differential mode disturbances
and signalling in the frequency range 2 kHz to 150 kHz at a.c. power ports;
– GB/T 17626.20-2014; Electromagnetic compatibility - Testing and measurement
techniques - Emission and immunity testing in transverse electromagnetic (TEM)
waveguide;
– GB/T 17626.21-2014, Electromagnetic compatibility - Testing and measurement
techniques - Reverberation chamber test methods;
– GB/T 17626.22-2017, Electromagnetic compatibility (EMC) - Testing and
measurement techniques - Radiated emissions and immunity measurements in fully
anechoic rooms (FARs);
– GB/T 17626.24-2012, Electromagnetic compatibility - Testing and measurement
techniques - Test methods for protective devices for HEMP conducted disturbance;
– GB/T 17626.27-2006, Electromagnetic compatibility (EMC) - Testing and
measurement techniques - Unbalance immunity test;
– GB/T 17626.28-2006, Electromagnetic compatibility (EMC) - Testing and
measurement techniques - Variation of power frequency immunity test;
– GB/T 17626.29-2006, Electromagnetic compatibility (EMC) - Testing and
measurement techniques - Voltage dips short interruptions and voltage variations on
d.c. input power port immunity tests;
– GB/T 17626.30-2012, Electromagnetic compatibility - Testing and measurement
techniques - Power quality measurement methods;
– GB/T 17626.31-2021, Electromagnetic compatibility - Testing and measurement
techniques - Part 31: AC mains ports broadband conducted disturbance immunity
test;
– GB/T 17626.33-2023, Electromagnetic compatibility - Testing and measurement
techniques - Part 33: Measurement methods for high-power transient parameters;
– GB/T 17626.34-2012, Electromagnetic compatibility - Testing and measurement
techniques - Voltage dips, short interruptions and voltage variations immunity tests
for equipment with mains current more than 16 A per phase;
This Standard replaces GB/T 17626.11-2008, Electromagnetic compatibility - Testing
and measurement techniques - Voltage dips, short interruptions and voltage varia...
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