GB/T 17626.5-2019 English PDF (GBT17626.5-2019)

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GB/T 17626.5-2019: Electromagnetic compatibility -- Testing and measurement techniques -- Surge immunity test
GB/T 17626.5-2019
Electromagnetic compatibility Test -- Testing and measurement techniques -- Surge immunity test
ICS 33.100.20
L06
National Standards of People's Republic of China
Replace GB/T 17626.5-2008
Electromagnetic compatibility test and measurement technology
Surge (impact) immunity test
Published on.2019-06-04
2020-01-01 implementation
State market supervision and administration
China National Standardization Administration issued
Content
Foreword I
1 range 1
2 Normative references 1
3 Terms, definitions and abbreviations 1
4 Overview 5
5 Test level 5
6 Test equipment 6
7 test configuration 18
8 Test procedure 20
9 Evaluation of test results 21
10 Test report 22
Appendix A (Normative Appendix) Surge Test for Unshielded Outdoor Symmetric Communication Lines Interconnected with Widely Distributed Systems 23
Appendix B (informative) Signal generator and test level selection 29
Appendix C (informative) Notes 32
Appendix D (informative) What to consider when implementing equipment that is connected to a low-voltage power system
Appendix E (informative) Mathematical model of surge waveforms 36
Appendix F (informative) Considerations for measurement uncertainty 44
Appendix G (informative) Calibration method for pulse measurement systems 51
Appendix H (informative) Coupling/decoupling method for applying surges to rated supply currents greater than.200A.
Reference 55
Foreword
GB/T 17626 "Electromagnetic Compatibility Test and Measurement Technology" is divided into the following parts.
--- Part 1. General overview of immunity test;
--- Part 2. Electrostatic discharge immunity test;
--- Part 3. Radio frequency electromagnetic field radiation immunity test;
--- Part 4. Electrical fast transient burst immunity test;
---Part 5. Surge (impact) immunity test;
--- Part 6. Conducted disturbance immunity of RF field induction;
--- Part 7. Guidelines for the measurement and measurement of harmonics and interharmonics of power supply systems and connected equipment;
---Part 8. Power frequency magnetic field immunity test;
---Part 9. Pulse magnetic field immunity test;
--- Part 10. Damping oscillating magnetic field immunity test;
--- Part 11. Voltage dips, short-term interruptions and voltage change immunity tests;
--- Part 12. Ringing wave immunity test;
--- Part 13. AC power port harmonics, interharmonics and low frequency immunity test of grid signals;
--- Part 14. Voltage fluctuation immunity test;
--- Part 15. Scintillator function and design specifications;
--- Part 16. 0Hz ~ 150kHz common mode conducted disturbance immunity test;
--- Part 17. Ripple immunity test of DC power input port;
---Part 18. Damping oscillator wave immunity test;
--- Part 20. Emission and immunity tests in transverse electromagnetic (TEM) waveguides;
--- Part 21. Mixing chamber test method;
--- Part 22. Radiated emissions and immunity measurements in full anechoic chambers;
--- Part 24. Test methods for HEMP conducted disturbance protection devices;
--- Part 27. Three-phase voltage unbalance immunity test;
--- Part 28. Power frequency change immunity test;
--- Part 29. DC power supply input port voltage dip, short-term interruption and voltage change immunity test;
--- Part 30. Power quality measurement methods;
--- Part 34. Voltage sag, short-term interruption and voltage change immunity test of equipment with main current per phase greater than 16A.
This part is the fifth part of GB/T 17626.
This part is drafted in accordance with the rules given in GB/T 1.1-2009.
This part replaces GB/T 17626.5-2008 "Electromagnetic compatibility test and measurement technology surge (impact) immunity test". versus
Compared with GB/T 17626.5-2008, the main technical changes are as follows.
--- Removed some of the referenced documents (see Chapter 2, Chapter 2 of the.2008 edition);
--- Added 3 new definitions (see 3.1.6, 3.1.11 and 3.1.15) and modified 2 definitions (see 3.1.8, 3.1.14,.2008)
3.7, 3.15);
--- Added abbreviations (see 3.2);
--- Increased the test level of line-line and line-ground (see Table 1, Table 1 of the.2008 version);
--- Modified the definition of the 1.2/50μs-8/20μs waveform parameters (see Table 2, Table 2 of the.2008 version);
--- Added a description of the calibration method for generator characteristics (see 6.2.3);
--- Removed the description of the 10/700μs combined wave generator (see Chapter 6, 6.2 of the.2008 version);
--- Modified the selection flow chart of the coupling/decoupling network (see Figure 4, 6.3 of the.2008 version);
--- Modified the requirements for CDN for AC/DC power supplies, adding open circuit voltage peaks for EUT ports of CDN
Relationship with the peak value of the short-circuit current (see 6.3.2, 6.3.1 of the.2008 version);
--- Added calibration on CDN (see 6.4);
--- Removed the description of the test configuration of the high-speed communication line (see Chapter 7, 7.5 of the.2008 version);
--- Removed the description of the test configuration for applying the potential difference (see Chapter 7,.2008 for 7.7);
--- Removed a description of the working status of the EUT (see Chapter 7, 7.8 of the.2008 version);
--- Added special instructions for surge test connected to external communication cable ports, in particular, specified 10/700μs combined wave
The technical parameters of the generator (see Appendix A, 6.2 of the.2008 version);
--- Added a mathematical model of the surge waveform (see Appendix E);
--- Added considerations about measurement uncertainty (see Appendix F);
--- Added calibration method for pulse measurement systems (see Appendix G);
--- Added coupling/decoupling method for applying surges to rated currents greater than.200A (see Appendix H).
This section uses the translation method equivalent to IEC 61000-4-5.2014 Electromagnetic Compatibility (EMC) Part 4-5. Test and Measurement Techniques
Surge (impact) immunity test.
The documents of our country that have a consistent correspondence with the international documents referenced in this part are as follows.
---GB/T 2900 (all parts) Electrical terminology [IEC 60050 (all parts)].
This section has made the following editorial changes.
--- The standard name was changed to "Electromagnetic Compatibility Test and Measurement Technology Surge (Impact) Immunity Test";
--- Amend the footnote a of Table 5 in the case of "open circuit" to "in the case of a short circuit";
--- Correct the figure "Line L2-line L3" in Figure 7 as "Line L3-line L2";
--- Correct the connection point of the combined wave generator to the coupling network in Figure 9, Figure 10, Figure A.4;
--- Amendment 7.1 "as described in 7.6.2 and Figure 12" is "as 7.6 and Figure 12";
--- Correct the "Tw" in Figure E.2 to "T";
--- Amend the F.4.6 "a reasonable value of α can be given the minimum value given in Table 1" as "a reasonable value of α can be used in Table F.4
The minimum value given in "";
--- Correct the "V'(tp)=0" in F.4.7 to "V'in(tp)=0".
This part is proposed and managed by the National Electromagnetic Compatibility Standardization Technical Committee (SAC/TC246).
This section drafted by. China Electronics Technology Standardization Institute, Suzhou Taisite Electronic Technology Co., Ltd., Beijing Fu Test Electronic Instrument
Co., Ltd., China Institute of Metrology, Lenovo (Beijing) Co., Ltd., Shanghai Institute of Metrology and Testing Technology, China Automotive Technology Research
Center Ltd.
The main drafters of this section. Li Huanran, Zhang Qiang, Randford, Huang Pan, Lu F...