Skip to product information
1 of 7

PayPal, credit cards. Download editable-PDF and invoice in 1 second!

JJF 1951-2021 English PDF

JJF 1951-2021 English PDF

Regular price $230.00 USD
Regular price Sale price $230.00 USD
Sale Sold out
Shipping calculated at checkout.
Delivery: 3 seconds. Download true-PDF + Invoice.
Get Quotation: Click JJF 1951-2021 (Self-service in 1-minute)
Historical versions (Master-website): JJF 1951-2021
Preview True-PDF (Reload/Scroll-down if blank)

JJF 1951-2021: Calibration Specification for Optical 3D Measuring Systems Based on Structured Light Scanning
JJF 1951-2021
Calibration Specification for Optical 3D Measuring Systems Based on Structured Light Scanning
National Metrology Technical Specification of the People's Republic of China
based on structured light scanning
Specification for calibration of optical three-dimensional measurement systems
Published on 2021-12-28
2022-06-28 Implementation
Released by the State Administration for Market Regulation
based on structured light scanning
Specification for calibration of optical three-dimensional measurement systems
Focal Point. National Technical Committee on Geometric Length Measurement
Main drafting unit. Beijing Great Wall Metrology and Testing Technology Research Institute of Aviation Industry
China Institute of Metrology
Beijing Institute of Aerospace Measurement and Testing Technology
Participating in the drafting unit. Zhejiang Institute of Metrology
Aviation Industry Shenyang Aircraft Industry (Group) Co., Ltd.
Beijing Tianyuan 3D Technology Co., Ltd.
GOMG Optical Measurement Technology (Shanghai) Co., Ltd. (GOMGmbH)
Hexagon Measurement Technology (Qingdao) Co., Ltd.
Baoli Machinery Co., Ltd.
This specification is interpreted by the National Technical Committee of Geometry and Length Measurement
The main drafters of this specification.
Wang Jihu (Beijing Great Wall Metrology and Testing Technology Research Institute of Aviation Industry)
Wang Weinong (China Institute of Metrology)
Gan Xiaochuan (Beijing Great Wall Metrology and Testing Technology Research Institute of Aviation Industry)
Liu Ke (Beijing Institute of Aerospace Measurement and Testing Technology)
Participating drafters.
Mao Zhenhua (Zhejiang Institute of Metrology)
Liu Hongxia [Aviation Industry Shenyang Aircraft Industry (Group) Co., Ltd.]
Li Renju (Beijing Tianyuan 3D Technology Co., Ltd.)
Zhao Liang [GOMG Optical Measurement Technology (Shanghai) Co., Ltd. (GOMGmbH)]
Wang Jin [Hexagon Measurement Technology (Qingdao) Co., Ltd.]
Gu Qingbai (Bao Li Machinery Co., Ltd.)
Table of contents
Introduction (Ⅱ)
1 range(1)
2 Terms and Definitions(1)
3 Overview(1)
4 Metrology Characteristics(2)
5 Calibration Conditions(3)
5.1 Operating Modes and Environmental Conditions(3)
5.2 Calibration software(3)
5.3 Standard for calibration (3)
6 Calibration items and methods(3)
6.1 Spherical shape detection error PF, size detection error PS (3)
6.2 Plane shape detection error F (4)
6.3 Spherical center distance measurement indication error SD (5)
7 Processing of calibration results (6)
8 Recalibration interval(6)
Appendix A Example of Uncertainty Evaluation of Indication Error of Ball Center Distance Measurement (7)
Appendix B Calibration Certificate Inside Page Format (9)
introduction
JJF 1071-2010 "Rules for the Compilation of National Metrology Calibration Standards", JJF 1001-2011 "General Metrology Terms and
Definition" and JJF 1059.1-2012 "Measurement Uncertainty Evaluation and Representation" together constitute the revision of this calibration specification
The basic series of specifications.
Part of this specification adopts VDI/VDE2634.2-2012 "Optical three-dimensional measurement system. Part 2.Based on area
Scanning), VDI/VDE2634.3-2008 "Optical three-dimensional measurement systems. Part 3.Area scanning based
Scanning) content.
Among them, the spherical shape detection error, the size detection error, the plane shape detection error, the spherical center distance measurement indication error
Isometric characteristics and calibration methods are consistent with the above standards.
This specification is published for the first time.
based on structured light scanning
Specification for calibration of optical three-dimensional measurement systems
1 Scope
This calibration specification applies to optical three-dimensional measurement systems based on structured light scanning (hereinafter referred to as structured light measurement systems).
system) calibration.
2 Terms and Definitions
The following terms and definitions apply to this specification.
2.1 point cloud[data] pointcloud[data]
A collection of spatial coordinate points that are obtained by measurement to characterize contour features and are associated with each other.
2.2 bat balbar, dumbbel
An etalon consisting of two spherical targets of the same diameter connected by a rigid structure.
2.3 balplate
A standard measuring tool consisting of a series of standard balls with different diameters and a fixed base plate.
2.4 Structured light
A beam with a defined pattern projected onto the surface of the profile being measured.
PF
The range of statistical variation in the radial distance between the measurement point and the fitted sphere.
2.6 Size probe error sizeprobeerror
PS
The difference between the standard sphere diameter obtained by point cloud fitting and the reference value.
2.7 Flatformprobeerror flatformprobeerror
In the vertical direction of the point cloud fitting plane, the maximum distance between all points in the point cloud.
2.8 sphere-spacingerror
SD
The difference between the measured value and the reference value of the center-to-center distance between two balls.
3 Overview
Structured light measurement system is a non-contact measurement device, by projecting structured light on the surface of the object to be measured, and passing through it.
The point cloud of the structured light pattern on the surface of the measured object is collected, and the surface contour features of the measured object are obtained by calculation. Structured Light Measurement System
The system is mainly composed of camera (including lens group), structured light projection device, calibration board and measurement software. typical structure
The composition of the optical measurement system is shown in Figure 1.
Structured light measurement systems are divided into single-view systems and multi-view systems. Single viewing angle system means that the structured light does not change during measurement

View full details