JJF 1015-2014 English PDF (JJF1015-2014)

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JJF 1015-2014: General Norm for Pattern Evaluation of Measuring Instruments
JJF 1015-2014
NATIONAL METROLOGY TECHNICAL SPECIFICATION
OF THE PEOPLE'S REPUBLIC OF CHINA
Replacing JJF 1015-2002
General Norm for Pattern Evaluation of
Measuring Instruments
ISSUED ON: JANUARY 23, 2014
IMPLEMENTED ON: JULY 23, 2014
Issued by: General Administration of Quality Supervision, Inspection and
Quarantine
General Norm for Pattern Evaluation
of Measuring Instruments
Replacing JJF 1015-2002
Jurisdiction organization: National Technical Committee of Legal Metrology
Metering Management
Drafting organizations: Beijing Institute of Metrology Detection
Beijing Bureau of Quality and Technical Supervision
China National Institute of Metrology
This Norm is entrusted to National Technical Committee of Legal Metrology
Metering Management for the interpretation.
Drafters of this Norm:
Wang, Zigang (Beijing Institute of Metrology Detection)
Chen, Jinghua (Beijing Bureau of Quality and Technical Supervision)
He, Zhao (China National Institute of Metrology).
Table of Contents
Foreword ... 5 
1 Scope ... 7 
2 Normative references ... 7 
3 Terms and definitions ... 7 
4 Technical information and test prototype that shall be submitted by the
application organization ... 8 
5 Pattern evaluation ... 9 
6 Handling of test prototype ... 12 
7 Handling of technical information ... 13 
Annex A Pattern Evaluation Report Format ... 14 
Annex B Format for “Explanation” on Prototype Retention of Pattern Evaluation
... 19 
Foreword
JJF 1015-2014 "General Norm for Pattern Evaluation of Measuring
Instruments" is a guiding technical specification for pattern evaluation of
measuring instruments.
JJF 1015-2014 "General Norm for Pattern Evaluation of Measuring
Instruments" was modified on the basis of JJF 1015-2002 "General Norm for
Pattern Evaluation and Pattern Approval of Measuring Instruments", which
references to partial contents of No.19 "Pattern evaluation and pattern
approval" of International Organization for Legal Metrology (OIML) and
combines with the relevant requirements proposed by the metrological
administrative department.
Compared with JJF 1015-2002, this Norm is only related to the pattern
evaluation of the measuring instruments. The pattern approval shall be
specified by relevant documents issued by the metrological administrative
department. The main changes of this revision are as follows:
- Add terms "single product" and "series product" ( see 3.3 and 3.4 );
- Add "Application for Pattern Approval of Measuring Instruments that was
accepted and entrusted by the government metrological administrative
department" in the submitted technical information (see 4.1);
- Make significant change in the submitted test prototype (see 4.2);
- Improve the approved pattern or specify the basis-change of the previous
pattern evaluation (see 5.1);
- Refine the examination of technical information to make it more operatable
(see 5.2);
- Divide the pattern evaluation into observation project and test project, so
as easy for description (see 5.3 and 5.4);
- Add "function verification" (see 5.4.1);
- Refine "stability test" (see 5.4.7);
- Change the way of "determination of pattern evaluation result"; it shall be
determined as qualified only when all the items for evaluation are qualified
(see 5.5);
- Enrich the "pattern evaluation report" by requiring records and photos to be
listed in the report as attachment (see 5.6);
- Change the handling of test prototype (see 6);
- Refine the "notices" of "pattern evaluation report" and specify 15-day
appeal period (see Appendix A);
- Add tables of "measurement parameters for measuring instruments",
"critical parts and materials", "list of equipment for pattern evaluation" and
"list of evaluation items and evaluation results";
- Delete contents relating to pattern approval;
- Delete basic safety test;
- Delete tests for adaptability of measuring performance in transport
simulation and retention simulation;
- Delete "handling for the first test failure".
The previous versions of this Norm are:
- JJF 1015-2002;
- JJF 1015-1990.
General Norm for Pattern Evaluation
of Measuring Instruments
1 Scope
This Norm is applicable to pattern evaluation of measuring instruments and
approved pattern’s compliance examination.
2 Normative references
This Norm takes the following documents as reference:
JJF 1016-2014 The Rules for Drafting Program of Pattern Evaluation of
Measuring Instruments;
JJF 1051 Designation and Classification Code for Measuring Instruments;
JJF 1069 Rules for the Examination of the Service of Legal Metrological
Verification.
For dated references, only the edition cited applies. For undated references,
the latest edition of the referenced document (including any amendments)
applies.
3 Terms and definitions
Terms and definitions defined by JJF 1001 "General Terms in Metrology and
Their Definitions" AND the following terms and definitions are applicable to this
Norm.
3.1 Measuring instrument
The single device or combination with one or multiple auxiliary equipment,
which are used for measuring.
3.2 Type (pattern) evaluation
The systematical examination and test on performance of one or multiple
samples in specified pattern according to document requirements on measuring
instruments, of which the results are written in the pattern evaluation report to
confirm if the pattern can be approved.
Note: The pattern of measuring instruments refers to the prototype as well as its technical
information (e.g., drawings, design material, software documents, etc.) of a certain
measuring instrument.
3.3 Single product
The product of one specification or model.
3.4 Series product
A group of products with same measuring principle, same or similar structure
(appearance), which meet one of the following conditions:
1) With same accuracy but with different measurement range;
2) With different accuracy but with same measuring range and structure.
4 Technical information and test prototype that shall
be submitted by the application organization
The applicant shall provide the technical information and test prototype required
by pattern evaluation to the technical agency who undertakes the pattern
evaluation.
4.1 Technical information
The following technical information shall be provided in two-sets by the
applicant:
- "Application for Pattern Approval of Measuring Instruments" accepted and
entrusted by the government metrological administrative department;
- Product standard;
- Assembly drawing, circuit diagram and critical parts list;
- Instructions for use;
- Test report made by manufacturer or technical agency;
- Explosion-proof certificate shall be provided if the test is carried out in the
explosive environment;
- Software evaluation report (if the government metrological administrative
department requires) issued by authorized agency.
4.2 Test prototype
The technical agency who undertakes the pattern evaluation shall require the
applicant to provide the test prototype according to provisions of pattern
evaluation outline if there is any; otherwise, determine the specification and
quantity of the prototype according to provisions of 6.13 of JJF 1016-2014.
5 Pattern evaluation
5.1 General principles
The pattern evaluation shall be carried out according to the pattern evaluation
outline.
The pattern evaluation includes tec...